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A Single Sampling Plan Based on Exponentially Weighted Moving Average Model for Linear Profiles
Author(s) -
Wang FuKwun
Publication year - 2016
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1914
Subject(s) - ewma chart , sampling (signal processing) , smoothing , exponential smoothing , statistics , index (typography) , plan (archaeology) , sample (material) , computer science , mathematics , process (computing) , control chart , filter (signal processing) , chemistry , archaeology , chromatography , world wide web , computer vision , history , operating system
The exponentially weighted moving average (EWMA) model has been successfully used in acceptance sampling plans. The EWMA model provides the quality information of the current lot and the preceding lots. In addition, a multiple dependent state (MDS) sampling plan considers the quality information of the preceding lots. In this study, we present two new sampling plans for linear profiles. One is based on EWMA model with yield index using the single sampling plan, and the other is based on EWMA model with yield index using the MDS sampling plans. The plan parameters are determined by a nonlinear optimization approach. As the smoothing parameter value equals to one, the first proposed plan becomes the traditional single sampling plan. In addition, we compare the proposed plans with the traditional single sampling plan. The results indicate that the MDS sampling plan based on EWMA model with yield index with smaller value of smoothing parameter performs better than the traditional single sampling plan and the single sampling plan based on EWMA model with yield index in terms of the sample size required. One real example is used to illustrate the proposed plan. Copyright © 2015 John Wiley & Sons, Ltd.