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Sampling Plan based on the Exponentially Weighted Moving Average Yield Index for Autocorrelation within Linear Profiles
Author(s) -
Tamirat Yeneneh,
Wang FuKwun
Publication year - 2016
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1911
Subject(s) - ewma chart , statistic , statistics , smoothing , autocorrelation , index (typography) , sampling (signal processing) , moving average , mathematics , exponential smoothing , acceptance sampling , computer science , econometrics , control chart , sample size determination , process (computing) , filter (signal processing) , world wide web , computer vision , operating system
Recently, the exponentially weighted moving average (EWMA) statistic has been applied to acceptance sampling plans. The advantage of EWMA statistic is to consider the quality of the current lot and the preceding lots. As the smoothing parameter value equals to one, the sampling plan based on the EWMA statistic becomes a single sampling plan. In this study, we propose a sampling plan based on the EWMA yield index for lot sentencing for autocorrelation within linear profiles. The plan parameters are determined by considering the acceptable quality level at the producer's risk and the lot tolerance percent defective at the consumer's risk. The plan parameters are tabulated for various combinations of the smoothing constant of EWMA statistic and the acceptable quality level and lot tolerance percent defective at two risks. An example is provided for illustrating the proposed plan. Copyright © 2015 John Wiley & Sons, Ltd.