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Single Mixed Sampling Plan Based on Yield Index for Linear Profiles
Author(s) -
Wang FuKwun,
Lo ShihChe
Publication year - 2016
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1892
Subject(s) - sampling (signal processing) , plan (archaeology) , sample (material) , acceptance sampling , quality (philosophy) , index (typography) , computer science , product (mathematics) , yield (engineering) , statistics , limiting , sample size determination , point (geometry) , mathematics , engineering , filter (signal processing) , philosophy , chemistry , geometry , materials science , archaeology , chromatography , epistemology , world wide web , metallurgy , computer vision , history , mechanical engineering
Acceptance sampling plans have been widely used to decide whether an inspection lot from a supplier should be accepted or rejected. According to an economical point of view, a mixed sampling plan is better than the sampling plan by attributes. In some situations, lot sentencing can be determined by sampling plans by attributes and by variables simultaneously on the same product. In this paper, we propose a single mixed acceptance sampling plan based on the yield index for linear profiles for lot sentencing. The plan parameters are determined by minimizing sample size through a nonlinear optimization method such that the producer's risk and the consumer's risk are satisfied simultaneously for given values of acceptable quality level and limiting quality level. The results indicate that our proposed plan outperforms the single attributes sampling plan in terms of the sample size. One real example is used to illustrate the proposed method. Copyright © 2015 John Wiley & Sons, Ltd.