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Reliability Model for Electronic Devices under Time Varying Voltage
Author(s) -
Méndez González Luis Carlos,
Rodríguez Borbón Manuel Iván,
VallesRosales Delia J.,
Del Valle Arturo,
Rodriguez Arnoldo
Publication year - 2016
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1867
Subject(s) - reliability (semiconductor) , parametric statistics , harmonics , voltage , transformer , power electronics , reliability engineering , engineering , power (physics) , electrical engineering , computer science , mathematics , statistics , physics , quantum mechanics
Present reliability models, which estimate the lifetime of electronic devices, work under the assumption that the voltage level must be constant when an Accelerated Life Testing is performed. Nevertheless, in a real operational environment, electronic devices are subjected to electrical variations present in the power lines; that means the voltage has a time‐varying behavior, which breaks the assumption of reliability models. Thus, in this paper, a reliability model is presented, which describes the lifetime of electronic devices under time‐varying voltage via a parametric function. The model is based on the Cumulative Damage Model with random failure rate and the modified Inverse Power Law. In order to estimate the parameters of the proposed model, the maximum likelihood method was employed. A case study based on the time‐varying voltage induced by electrical harmonics when Alternate Current/Direct Current (AC/DC) transformer is connected to the power line is presented in this paper. Copyright © 2015 John Wiley & Sons, Ltd.