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Control Charts for the Lognormal Mean
Author(s) -
Huang WeiHeng,
Wang Hsiuying,
Yeh Arthur B.
Publication year - 2016
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1841
Subject(s) - log normal distribution , control chart , statistical process control , statistics , normal distribution , distribution fitting , computer science , mathematics , process (computing) , probability distribution , operating system
Among a set of tools that form the core of statistical process control, statistical control charts are most commonly used for controlling, monitoring, and improving processes. The conventional control charts are based on the assumption that the distribution of the quality characteristic to be monitored follows the normal distribution. However, in real applications, many process distributions may follow a positively skewed distribution such as the lognormal distribution. In this study, we discuss the construction of several control charts for monitoring the mean of the lognormal distribution. A real example is used to demonstrate how these charts can be applied in practice. Copyright © 2015 John Wiley & Sons, Ltd.