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Variables Sampling Plan for Resubmitted Lots in a Process with Linear Profiles
Author(s) -
Wang FuKwun
Publication year - 2016
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1812
Subject(s) - sampling (signal processing) , plan (archaeology) , acceptance sampling , process capability index , computer science , process (computing) , quality (philosophy) , set (abstract data type) , index (typography) , operations research , engineering , operations management , statistics , mathematics , work in process , sample size determination , archaeology , computer vision , philosophy , programming language , filter (signal processing) , epistemology , world wide web , history , operating system
Acceptance sampling plans include a sampling scheme and a set of rules for determining whether an inspection lot from a supplier should be accepted or rejected. In some circumstances, the supplier is allowed to resubmit lots for further inspection when the original inspection result is unacceptable. In this study, two variables sampling plans based on the process‐yield index for a process with linear profiles are proposed to deal with lot sentencing. The single sampling plan is a special case of the resubmitted lots sampling plan. The plan parameters are determined using a nonlinear optimization method under the given values of producer's risk, consumer's risk, acceptable quality level, and lot tolerance percent defective. Numerous tables are provided to determine the plan parameters. One real example is used to illustrate our proposed method. Copyright © 2015 John Wiley & Sons, Ltd.