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Bayesian Control Chart for Nonconformities
Author(s) -
Raubenheimer L.,
Merwe A.J.
Publication year - 2015
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1668
Subject(s) - chart , control chart , frequentist inference , x bar chart , poisson distribution , bayesian probability , statistics , control limits , mathematics , computer science , bayesian inference , process (computing) , operating system
The c ‐chart or the control chart for nonconformities is designed for the case where one deals with the number of defects or nonconformities observed. A control chart can be developed for the total or average number of nonconformities per unit, which is well modeled by the Poisson distribution. In this paper the c ‐chart will be studied, where the usual operation of the c ‐chart will be extended by introducing a Bayesian approach for the c ‐chart. Control chart limits, average run lengths, and false alarm rates will be determined by using a Bayesian method. These results will be compared with the results obtained when using the classical (frequentist) method. Copyright © 2014 John Wiley & Sons, Ltd.