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A Note on “Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index C pk ”
Author(s) -
Pearn W. L.,
Wu C. H.,
Tsai M. C.
Publication year - 2013
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1295
Subject(s) - generalization , estimator , process capability index , index (typography) , yield (engineering) , process capability , mathematics , upper and lower bounds , statistics , computer science , engineering , work in process , operations management , mathematical analysis , materials science , world wide web , metallurgy
The generalized yield index C pk T establishes the relationship between the manufacturing specifications and the actual process performance, which provides a lower bound on process yield for two‐sided processes with multiple characteristics. The results attended are very practical for industrial application. In this article, we extended the results in cases with one‐sided specification and multiple characteristics. The generalized index C PU T was considered, and the asymptotic distribution of the natural estimatorC ^ PU T was developed. Then, we derived the lower confidence bounds as well as the critical values of index C PU T . We not only provided some tables but also presented an application example. Copyright © 2012 John Wiley & Sons, Ltd.