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Warranty Data Analysis: A Review
Author(s) -
Wu Shaomin
Publication year - 2012
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1282
Subject(s) - warranty , reliability (semiconductor) , product (mathematics) , quality (philosophy) , computer science , risk analysis (engineering) , reliability engineering , business , operations research , engineering , political science , power (physics) , philosophy , physics , geometry , mathematics , epistemology , quantum mechanics , law
Warranty claims and supplementary data contain useful information about product quality and reliability. Analysing such data can therefore be of benefit to manufacturers in identifying early warnings of abnormalities in their products, providing useful information about failure modes to aid design modification, estimating product reliability for deciding on warranty policy and forecasting future warranty claims needed for preparing fiscal plans. In the last two decades, considerable research has been conducted in warranty data analysis (WDA) from several different perspectives. This article attempts to summarise and review the research and developments in WDA with emphasis on models, methods and applications. It concludes with a brief discussion on current practices and possible future trends in WDA. Copyright © 2012 John Wiley & Sons, Ltd.