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Nonparametric Synthetic Control Charts for Process Variation
Author(s) -
Khilare S. K.,
Shirke D. T.
Publication year - 2012
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1233
Subject(s) - control chart , nonparametric statistics , markov chain , computer science , statistical process control , statistics , synthetic data , process (computing) , mathematics , operating system
In this article, we propose nonparametric synthetic and side‐sensitive synthetic control charts for controlling fraction nonconforming due to increase in the process variation. Synthetic control chart is a combination of sign and conforming run length control charts. We compare performance of the proposed control charts with the Shewhart sign and S 2 charts. Our performance study shows that the proposed control charts have a higher power of detecting out‐of‐control signal. We also study the steady‐state behavior of a nonparametric synthetic control chart. We present a Markov chain model to evaluate the steady‐state average run length of the synthetic and side‐sensitive synthetic control charts. Copyright © 2011 John Wiley & Sons, Ltd.

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