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The mean time between failures for an LCD panel
Author(s) -
Wang FuKwun,
Chu TaoPeng
Publication year - 2011
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1113
Subject(s) - weibull distribution , reliability (semiconductor) , log logistic distribution , goodness of fit , statistics , mean time between failures , logistic distribution , distribution (mathematics) , mathematics , distribution fitting , reliability engineering , probability distribution , econometrics , engineering , failure rate , logistic regression , physics , power (physics) , mathematical analysis , quantum mechanics
The calculation of mean time between failures is very important in reliability life data analysis. For different distributions, the values of mean time between failures are always different. The two‐parameter Weibull distribution is widely used in reliability engineering. However, some distributions may offer a better fit of data. This paper aims to develop an algorithm for determining the best‐fitted distribution of a liquid crystal display panel based on the field return data. The two‐parameter and three‐parameter Weibull distributions and other distributions such as the Burr XII distribution, the Pareto distribution and the Log‐logistic distribution are compared to provide a better characterization of the life data which is based on the maximum value of all log‐likelihood functions. We also provide a goodness‐of‐fit test for the best‐fitted distribution. It is recommended that the Burr XII distribution could be used to characterize the reliability life of a liquid crystal display panel. Copyright © 2010 John Wiley & Sons, Ltd.