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Reliability estimation by ALT when no analytical model holds
Author(s) -
Lantiéri, P.,
Guérin F.,
Hambli R.
Publication year - 2010
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1085
Subject(s) - reliability (semiconductor) , finite element method , term (time) , accelerated life testing , reliability engineering , numerical analysis , stress (linguistics) , computer science , structural engineering , mathematics , engineering , statistics , mathematical analysis , physics , power (physics) , quantum mechanics , weibull distribution , linguistics , philosophy
This paper presents an accelerated life testing method applicable to devices or systems when no analytical relationship with respect to the stress level can be defined. If a numerical approach remains possible, the numerical model can be fitted to the accelerated test results. Thus, long‐term failures can be predicted from short tests. This method is carried out in the case of fatigue, the evolution of the damage leading to the failure having to be modeled by a numerical finite element method. Copyright © 2010 John Wiley & Sons, Ltd.