Premium
An approach that can quickly assess product reliability
Author(s) -
Zanoff J.,
EkwaroOsire S.
Publication year - 2010
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1080
Subject(s) - reliability engineering , reliability (semiconductor) , schedule , product (mathematics) , computer science , new product development , task (project management) , production (economics) , test strategy , component (thermodynamics) , engineering , systems engineering , software , power (physics) , physics , geometry , mathematics , thermodynamics , quantum mechanics , marketing , economics , business , macroeconomics , programming language , operating system
One of the ways to determine the inherent reliability of a design is to test it under controlled environments based on the product usage that is understood by the development requirements. This can be accomplished by performing a reliability growth test on the product. A testing approach can be developed that enhances the product reliability and reduces the production testing cycle. Research performed to date points to the fact that this proposed methodology may not exist, and is the focus of continued research to refine the development of an approach to fill this gap. The combining of multiple testing approaches in order to ensure that the reliability requirement is met or exceeded while at the same time having the capability to reduce the testing cycle time when required due to schedule and cost constraints has not been addressed in the open literature till date. The methodology is to utilize a combination of multiple testing approaches to accomplish this task by exploring complementary testing ideas from various technologies that have been utilized previously with documented success. This approach demonstrated that component‐level testing reduced the product‐level failures by greater than 80% while at the same time reducing the schedule to complete all testing. Copyright © 2009 John Wiley & Sons, Ltd.