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Process selection for higher production yield based on capability index S pk
Author(s) -
Lin Chenju,
Pearn W. L.
Publication year - 2010
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.1051
Subject(s) - selection (genetic algorithm) , factory (object oriented programming) , production (economics) , yield (engineering) , process (computing) , index (typography) , process capability index , thin film transistor , power (physics) , computer science , process capability , generalization , power consumption , mathematics , reliability engineering , industrial engineering , engineering , work in process , artificial intelligence , operations management , materials science , economics , macroeconomics , mathematical analysis , world wide web , composite material , operating system , layer (electronics) , quantum mechanics , metallurgy , programming language , physics
Process selection is the problem of comparing two processes and selecting the one that has a higher capability value. In this paper, we consider the process selection problem by using the yield index S pk to compare two production processes and select one that has higher production yield. An analytical exact approach is proposed to solve this problem. Testing hypotheses with two phases for comparing two processes are developed. Critical values of the test are obtained to determine the selection decisions. Sample sizes required for designated selection power and confidence level are also investigated. The results provide useful information to practitioners. An application example on comparing two thin‐film transistor (TFT) type liquid‐crystal display (LCD) production processes is presented to illustrate the practicality of the proposed approach to a real problem in the factory. Copyright © 2009 John Wiley & Sons, Ltd.