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A Novel Combinatorial Approach to the Ferroelectric Properties in Hf x Zr 1− x O 2 Deposited by Atomic Layer Deposition
Author(s) -
Jung Yong Chan,
Mohan Jaidah,
Hwang Su Min,
Kim Jin-Hyun,
Le Dan N.,
Sahota Akshay,
Kim Namhoon,
Hernandez-Arriaga Heber,
Veyan Jean-Francois,
Kim Harrison Sejoon,
Kim Si Joon,
Choi Rino,
Kim Jiyoung
Publication year - 2021
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.202100053
Subject(s) - ferroelectricity , atomic layer deposition , materials science , x ray photoelectron spectroscopy , tin , doping , thin film , ternary operation , analytical chemistry (journal) , nanotechnology , crystallography , dielectric , optoelectronics , chemical engineering , chemistry , organic chemistry , computer science , engineering , metallurgy , programming language
Since HfO 2 ‐based ferroelectric films were reported in 2011, several doping/alloying elements have been introduced to secure interesting ferroelectric/antiferroelectric properties of Hf‐based fluorite‐structured thin films. Using a conventional approach by atomic layer deposition (ALD), an enormous number of experiments would be required to reveal the compositional effects of doping/alloying components in ternary and quaternary systems. Therefore, for a comprehensive study of the ferroelectric properties of Hf x Zr 1− x O 2 , a novel combinatorial ALD technique that enables the fabrication of multicomponent films with a different composition ratio and thickness via saturated/non‐saturated ALD without changing the supercycle of each material is reported. The gradient of the amount of HfO 2 over a 100 mm substrate is achieved using a lower Hf‐precursor temperature that results in an insufficient Hf‐precursor dose for saturated deposition. Systematic study on the Hf x Zr 1− x O 2 combinatorial library is carried out by spectroscopic ellipsometry, X‐ray photoelectron spectroscopy, and X‐ray diffraction. Furthermore, TiN/Hf x Zr 1− x O 2 /TiN capacitors are fabricated to measure the remnant polarization. The obtained results clearly show the ferroelectric–antiferroelectric transition according to continuous composition change instead of discrete research. Therefore, a highly productive method for studying ferroelectricity changes in terms of a doping and a composition of HfO 2 ‐based ferroelectric thin films through a novel ALD combinatorial approach is proposed.