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Increasing the Diversity and Understanding of Semiconductor Nanoplatelets by Colloidal Atomic Layer Deposition
Author(s) -
Reichhelm Annett,
Hübner René,
Damm Christine,
Nielsch Kornelius,
Eychmüller Alexander
Publication year - 2020
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.202000282
Subject(s) - high resolution transmission electron microscopy , materials science , nanotechnology , colloid , layer (electronics) , atomic layer deposition , deposition (geology) , transmission electron microscopy , monolayer , semiconductor , chemical engineering , optoelectronics , paleontology , sediment , engineering , biology
Nanoplatelets (NPLs) are a remarkable class of quantum confined materials with size‐dependent optical properties, which are determined by the defined thickness of the crystalline platelets. To increase the variety of species, the colloidal atomic layer deposition method is used for the preparation of increasingly thicker CdSe NPLs. By growing further crystalline layers onto the surfaces of 4 and 5 monolayers (MLs) thick NPLs, species from 6 to 13 MLs are achieved. While increasing the thickness, the heavy‐hole absorption peak shifts from 513 to 652 nm, leading to a variety of NPLs for applications and further investigations. The thickness and number of MLs of the platelet species are determined by high‐resolution transmission electron microscopy (HRTEM) measurements, allowing the interpretation of several contradictions present in the NPL literature. In recent years, different assumptions are published, leading to a lack of clarity in the fundamentals of this field. Regarding the ongoing scientific interest in NPLs, there is a certain need for clarification, which is provided in this study.