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Back Cover: Low energy scanning transmission electron beam induced current for nanoscale characterization of p–n junctions (Phys. Status Solidi RRL 1/2017)
Author(s) -
Peretzki Patrick,
Ifland Benedikt,
Jooss Christian,
Seibt Michael
Publication year - 2017
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.201770303
Subject(s) - cover (algebra) , characterization (materials science) , nanoscopic scale , current (fluid) , cathode ray , materials science , optoelectronics , energy (signal processing) , electron beam induced current , electron , nanotechnology , physics , electrical engineering , engineering , quantum mechanics , mechanical engineering , silicon
No abstract is available for this article.