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Magnetic anisotropy axis reorientation at ultrathin FePt films
Author(s) -
Kaidatzis Andreas,
Psycharis Vassilis,
Giannopoulos Georgios,
GarcíaMartín José Miguel,
Niarchos Dimitrios
Publication year - 2017
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.201600386
Subject(s) - materials science , coercivity , hysteresis , crystallite , film plane , anisotropy , monocrystalline silicon , magnetic anisotropy , condensed matter physics , magnetic hysteresis , perpendicular , thin film , sputter deposition , composite material , optics , sputtering , magnetization , optoelectronics , nanotechnology , silicon , magnetic field , metallurgy , physics , geometry , mathematics , quantum mechanics
Ultrathin FePt films (thickness between 1 nm and 5 nm) were studied for non‐volatile memories applications. The films were magnetron sputtered on monocrystalline MgO⟨001⟩ substrates at 500 °C. The films are polycrystalline, except the 1 nm thick film which is not continuous. It is shown that films with thickness higher than 2.7 nm have L1 0 structure and perpendicular magnetic anisotropy, while a transition to in‐plane anisotropy occurs for thinner films. The out‐of‐plane coercivity drops from 16 kOe at the thicker film to 0.5 kOe at the thinner one.Hysteresis cycles of FePt films as a function of film thickness.