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Measurement of strong photon recycling in ultra‐thin GaAs n/p junctions monolithically integrated in high‐photovoltage vertical epitaxial heterostructure architectures with conversion efficiencies exceeding 60%
Author(s) -
Proulx F.,
York M. C. A.,
Provost P. O.,
Arès R.,
Aimez V.,
Masson D. P.,
Fafard S.
Publication year - 2017
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.201600385
Subject(s) - responsivity , heterojunction , optoelectronics , quantum efficiency , excitation , materials science , semiconductor , photon , photovoltaic effect , epitaxy , voltage , optical power , biasing , photovoltaic system , optics , photodetector , physics , electrical engineering , laser , nanotechnology , layer (electronics) , quantum mechanics , engineering
Photon‐recycling effects are studied experimentally in photovoltaic power converting III–V semiconductor devices designed with the vertical epitaxial heterostructure architecture (VEHSA). The responsivity of VEHSA structures with multiple thin GaAs n/p junctions is measured for various optical input powers and for different wavelength detuning values with respect to the peak of the spectral response. While the detuning of the optical excitation decreases the external quantum efficiency and the responsivity at low input powers, this study demonstrates that at high optical intensities, a large fraction of the performance can be recovered despite significant detuning values. The photon coupling effects therefore broaden the spectral range for which the VEHSA devices convert high‐power optical inputs with high efficiencies into an electrical output having a preset voltage. The devices exhibit a near optimum responsivity of up to 0.645 A/W for tuned excitation conditions or at high optical intensities for spectral detuning values of up to ∼25 nm and corresponding to an external quantum efficiency of ∼94%. Efficiencies of 62.0% and 61.8% have been obtained for current‐matched excitations and for a detuning of >10 nm, respectively. An output power of 5.87 W is reported and an open circuit voltage enhancement of 92 meV per n/p junction is measured compared to a device with a side by side planar architecture. (© 2016 WILEY‐VCH Verlag GmbH &Co. KGaA, Weinheim)