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Structure and orbital ordering of ultrathin LaVO 3 probed by atomic resolution electron microscopy and Raman spectroscopy
Author(s) -
LindforsVrejoiu Ionela,
Jin Lei,
Himcinschi Cameliu,
Engelmayer Johannes,
Hensling Felix,
Jia ChunLin,
Waser Rainer,
Dittmann Regina,
Loosdrecht Paul H. M.
Publication year - 2017
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.201600350
Subject(s) - raman spectroscopy , materials science , raman scattering , thin film , epitaxy , spectroscopy , electron microscope , scanning electron microscope , resolution (logic) , electron , microscopy , condensed matter physics , molecular physics , optics , chemistry , nanotechnology , layer (electronics) , physics , quantum mechanics , artificial intelligence , computer science , composite material
Orbital ordering has been less investigated in epitaxial thin films, due to the difficulty to evidence directly the occurrence of this phenomenon in thin film samples. Atomic resolution electron microscopy enabled us to observe the structural details of the ultrathin LaVO 3 films. The transition to orbital ordering of epitaxial layers as thin as ≈4 nm was probed by temperature‐dependent Raman scattering spectroscopy of multilayer samples. From the occurrence and temperature dependence of the 700 cm –1 Raman active mode it can be inferred that the structural phase transition associated with orbital ordering takes place in ultrathin LaVO 3 films at about 130 K.