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CVD grown 2D MoS 2 layers: A photoluminescence and fluorescence lifetime imaging study
Author(s) -
Özden Ayberk,
Şar Hüseyin,
Yeltik Aydan,
Madenoğlu Büşra,
Sevik Cem,
Ay Feridun,
Perkgöz Nihan Kosku
Publication year - 2016
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.201600204
Subject(s) - photoluminescence , materials science , fluorescence , quenching (fluorescence) , raman spectroscopy , chemical vapor deposition , microscopy , monolayer , grain boundary , fluorescence lifetime imaging microscopy , optoelectronics , thin film , analytical chemistry (journal) , optics , nanotechnology , chemistry , microstructure , composite material , physics , chromatography
In this letter, we report on the fluorescence lifetime imaging and accompanying photoluminescence properties of a chemical vapour deposition (CVD) grown atomically thin material, MoS 2 . µ‐Raman, µ‐photoluminescence (PL) and fluorescence lifetime imaging microscopy (FLIM) are utilized to probe the fluorescence lifetime and photoluminescence properties of individual flakes of MoS 2 films. Usage of these three techniques allows identification of the grown layers, grain boundaries, structural defects and their relative effects on the PL and fluorescence lifetime spectra. Our investigation on individual monolayer flakes reveals a clear increase of the fluorescence lifetime from 0.3 ns to 0.45 ns at the edges with respect to interior region. On the other hand, investigation of the film layer reveals quenching of PL intensity and lifetime at the grain boundaries. These results could be important for applications where the activity of edges is important such as in photocatalytic water splitting. Finally, it has been demonstrated that PL mapping and FLIM are viable techniques for the investigation of the grain‐boundaries.