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Ultrafast transverse thermoelectric response in c ‐axis inclined epitaxial La 0.5 Sr 0.5 CoO 3 thin films
Author(s) -
Yu Lan,
Wang Yong,
Zhang Pengxiang,
Habermeier HannsUlrich
Publication year - 2013
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.201307002
Subject(s) - thermoelectric effect , thin film , materials science , electrical resistivity and conductivity , ultrashort pulse , epitaxy , transverse plane , response time , analytical chemistry (journal) , penetration depth , pulsed laser deposition , optics , condensed matter physics , optoelectronics , laser , nanotechnology , chemistry , physics , thermodynamics , computer graphics (images) , structural engineering , engineering , layer (electronics) , quantum mechanics , chromatography , computer science
Ultrafast transverse thermoelectric voltage response has been observed in c ‐axis inclined epitaxial La 0.5 Sr 0.5 CoO 3 thin films. Voltage signals with the rise time of 7 ns have been detected under the irradiation of pulse laser with duration of 28 ns. A concept, named response rate ratio, has been proposed to evaluate the intrinsic response rate, and this ratio in La 0.5 Sr 0.5 CoO 3 is smaller than that in other reported materials. The low resistivity is thought to be responsible for the ultrafast response, as low resistivity induces small optical penetration depth, and response time has a monotonous increasing relationship with this depth.Transverse thermoelectric voltage with the rise time of 7 ns in La 0.5 Sr 0.5 CoO 3 thin film. (© 2013 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)