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Look fast: Crystallization of conjugated molecules during solution shearing probed in‐situ and in real time by X‐ray scattering
Author(s) -
Smilgies DetlefM.,
Li Ruipeng,
Giri Gaurav,
Chou Kang Wei,
Diao Ying,
Bao Zhenan,
Amassian Aram
Publication year - 2013
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.201206507
Subject(s) - crystallization , shearing (physics) , nucleation , materials science , thin film , scattering , conjugated system , microbeam , molecule , chemical engineering , thin film transistor , in situ , crystallography , optics , nanotechnology , composite material , polymer , chemistry , organic chemistry , physics , layer (electronics) , engineering
Abstract High‐speed solution shearing, in which a drop of dissolved material is spread by a coating knife onto the substrate, has emerged as a versatile, yet simple coating technique to prepare high‐mobility organic thin film transistors. Solution shearing and subsequent drying and crystallization of a thin film of conjugated molecules is probed in situ using microbeam grazing incidence wide‐angle X‐ray scattering (μGIWAXS). We demonstrate the advantages of this approach to study solution based crystal nucleation and growth, and identify casting parameter combinations to cast highly ordered and laterally aligned molecular thin films.(© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)