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Temperature dependence of the Raman spectra of Bi 2 Te 3 and Bi 0.5 Sb 1.5 Te 3 thermoelectric films
Author(s) -
Li Duanhui,
Li Liangliang,
Liu DaWei,
Li JingFeng
Publication year - 2012
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.201206149
Subject(s) - raman spectroscopy , thermoelectric effect , analytical chemistry (journal) , thermal conductivity , raman scattering , materials science , spectral line , thermoelectric materials , chemistry , thermodynamics , physics , optics , chromatography , astronomy , composite material
The temperature dependence of the Raman spectra of Bi 2 Te 3 and Bi 0.5 Sb 1.5 Te 3 thermoelectric films was investigated. The temperature coefficients of the E g (2) peak positions were determined as –0.0137 cm –1 /°C and –0.0156 cm –1 /°C, respectively. The thermal expansion of the crystal caused a linear shift of the Raman peak induced by the temperature change. Based on the linear relation, a reliable and noninvasive micro‐Raman scattering method was shown to measure the thermal conductivity of the thermoelectric films. (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)