Temperature dependence of the Raman spectra of Bi 2 Te 3  and Bi 0.5 Sb 1.5 Te 3  thermoelectric films | Zendy

Li Duanhui | Zendy; Li Liangliang | Zendy; Liu DaWei | Zendy; Li JingFeng | Zendy

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Temperature dependence of the Raman spectra of Bi 2 Te 3 and Bi 0.5 Sb 1.5 Te 3 thermoelectric films

Author(s) -

Li Duanhui,

Li Liangliang,

Liu DaWei,

Li JingFeng

Publication year - 2012

Publication title -

physica status solidi (rrl) – rapid research letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.786

H-Index - 68

eISSN - 1862-6270

pISSN - 1862-6254

DOI - 10.1002/pssr.201206149

Subject(s) - raman spectroscopy , thermoelectric effect , analytical chemistry (journal) , thermal conductivity , raman scattering , materials science , spectral line , thermoelectric materials , chemistry , thermodynamics , physics , optics , chromatography , astronomy , composite material

The temperature dependence of the Raman spectra of Bi 2 Te 3 and Bi 0.5 Sb 1.5 Te 3 thermoelectric films was investigated. The temperature coefficients of the E g (2) peak positions were determined as –0.0137 cm –1 /°C and –0.0156 cm –1 /°C, respectively. The thermal expansion of the crystal caused a linear shift of the Raman peak induced by the temperature change. Based on the linear relation, a reliable and noninvasive micro‐Raman scattering method was shown to measure the thermal conductivity of the thermoelectric films. (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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