Real time spectroscopic ellipsometry of CuInSe 2 : Growth dynamics, dielectric function, and its dependence on temperature | Zendy

Begou Thomas | Zendy; Walker James D. | Zendy; Attygalle Dinesh | Zendy; Ranjan Vikash | Zendy; Collins R. W. | Zendy; Marsillac Sylvain | Zendy

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Real time spectroscopic ellipsometry of CuInSe 2 : Growth dynamics, dielectric function, and its dependence on temperature

Author(s) -

Begou Thomas,

Walker James D.,

Attygalle Dinesh,

Ranjan Vikash,

Collins R. W.,

Marsillac Sylvain

Publication year - 2011

Publication title -

physica status solidi (rrl) – rapid research letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.786

H-Index - 68

eISSN - 1862-6270

pISSN - 1862-6254

DOI - 10.1002/pssr.201105204

Subject(s) - ellipsometry , nucleation , dielectric , dielectric function , surface roughness , indium , yield (engineering) , materials science , analytical chemistry (journal) , activation energy , chemistry , thin film , thermodynamics , optoelectronics , nanotechnology , composite material , physics , chromatography

This Letter reports real time spectroscopic ellipsometry studies of copper indium diselenide (CuInSe 2 ; CIS). A Volmer‐Weber nucleation process was identified from the measured thickness dynamics, and accurate dielectric functions were obtained in‐situ , avoiding oxidation while correcting for surface roughness. The energy and broadening parameters of the critical points in the dielectric functions obtained versus measurement temperature (including three previously unreported ones) yield a database that is valuable for on‐line materials analysis. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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