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Real time spectroscopic ellipsometry of CuInSe 2 : Growth dynamics, dielectric function, and its dependence on temperature
Author(s) -
Begou Thomas,
Walker James D.,
Attygalle Dinesh,
Ranjan Vikash,
Collins R. W.,
Marsillac Sylvain
Publication year - 2011
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.201105204
Subject(s) - ellipsometry , nucleation , dielectric , dielectric function , surface roughness , indium , yield (engineering) , materials science , analytical chemistry (journal) , activation energy , chemistry , thin film , thermodynamics , optoelectronics , nanotechnology , composite material , physics , chromatography
This Letter reports real time spectroscopic ellipsometry studies of copper indium diselenide (CuInSe 2 ; CIS). A Volmer‐Weber nucleation process was identified from the measured thickness dynamics, and accurate dielectric functions were obtained in‐situ , avoiding oxidation while correcting for surface roughness. The energy and broadening parameters of the critical points in the dielectric functions obtained versus measurement temperature (including three previously unreported ones) yield a database that is valuable for on‐line materials analysis. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)