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Nanoscale piezoresponse of 70 nm poly(vinylidene fluoride‐trifluoro‐ethylene) films annealed at different temperatures
Author(s) -
Choi YoonYoung,
Hong Jongin,
Hong Seungbum,
Song Hanwook,
Cheong DeokSoo,
No Kwangsoo
Publication year - 2010
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.201004009
Subject(s) - piezoresponse force microscopy , materials science , ferroelectricity , annealing (glass) , fourier transform infrared spectroscopy , nanoscopic scale , piezoelectricity , infrared , fluoride , diffraction , analytical chemistry (journal) , optoelectronics , nanotechnology , composite material , chemical engineering , optics , dielectric , organic chemistry , chemistry , inorganic chemistry , engineering , physics
In order to characterize the piezoelectric properties of 70 nm thick poly(vinylidene fluoride‐trifluoroethylene), P(VDF‐TrFE), films grown by a spin‐coating technique, both nanoscale manipulation and polarization switching were studied using piezoresponse force microscopy (PFM). We varied the annealing temperature from 75 °C to 145 °C and achieved a high‐quality 70 nm P(VDF‐TrFE) film annealed at the temperature of 95 °C. Ferroelectric domains and their properties were confirmed using X‐ray diffraction, grazing incidence reflection absorption Fourier Transform Infrared (GIRA‐FTIR) and PFM analysis. The ferroelectric domains in the film were homogeneously switchable below 5 V with a remnant d 33 of 14.9 pm/V. This offers our rationale for a promise in energy harvesting and switchability would be good for plastic electronics. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)