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Quantitative evaluation of electroluminescence images of solar cells
Author(s) -
Breitenstein O.,
Khanna A.,
Augarten Y.,
Bauer J.,
Wagner J.M.,
Iwig K.
Publication year - 2010
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.200903304
Subject(s) - electroluminescence , ohmic contact , equivalent series resistance , voltage , conductance , optics , saturation current , thermography , series (stratigraphy) , materials science , physics , condensed matter physics , electrical engineering , nanotechnology , geology , engineering , paleontology , infrared , layer (electronics)
A fast converging iterative procedure is proposed to calculate series resistance ( R s ) and saturation current ( j 0 ) images from two electroluminescence (EL) images taken at two biases. It is not necessary here that for one bias the influence of the series resistance is negligible. Moreover, voltage series of EL images have been evaluated for calculating images of R s , j 0 , and the parallel conductance G p separately. However, it has been found that R s variations cannot uniquely be separated from G p variations. The reason for this is discussed. Thus, for quantitatively detecting weak ohmic shunts, EL imaging cannot replace lock‐in thermography. For strong ohmic shunts a formula for converting EL images into shunt images is given. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)