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Tuning the lifetime of the surface plasmon upon sputtering
Author(s) -
Politano A.,
Chiarello G.
Publication year - 2009
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.200903082
Subject(s) - plasmon , laser linewidth , surface plasmon , sputtering , localized surface plasmon , materials science , fluence , electron energy loss spectroscopy , spectroscopy , optoelectronics , excitation , surface plasmon polariton , optics , thin film , nanotechnology , physics , laser , transmission electron microscopy , quantum mechanics
The lifetime of the surface plasmon in sputtered Ag ultrathin films on Cu(111) was investigated by high‐resolution electron energy loss spectroscopy measurements. The linewidth of the surface plasmon was found to follow a square‐root dependence on the fluence. Such finding allows the tuning of the lifetime of the plasmonic excitation upon sputtering and has general implications in plasmon‐based spectroscopies and in plasmon‐mediated processes across the films and at their surfaces. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)