z-logo
Premium
Piezoresistivity in GaAs/In x Ga 1– x As/AlAs superlattice structures
Author(s) -
Zhang Wendong,
Hu Jie,
Xue Chenyang,
Zhang Binzhen,
Xiong Jijun,
Qiao Hui,
Li Junhong
Publication year - 2008
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.200701273
Subject(s) - superlattice , materials science , condensed matter physics , crystallography , optoelectronics , physics , chemistry
We report on a strong piezoresistive effect in GaAs/ In x Ga 1– x As/AlAs superlattice structures fabricated on a GaAs‐base cantilever. The measurements of the piezoresistive properties were performed for tensile strains by static pressure experiments. The maximum gauge factor (GF) for the GaAs/In x Ga 1– x As/AlAs epilayer can be estimated to 200, which is higher than the value of the gauge factor reported for Si transducers. Our results demonstrate a higher potential of GaAs/In x Ga 1– x As/AlAs superlattice structures for the development of piezoresistive sensors. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom