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Plasmon energy chemical phase mapping of reactive multilayers
Author(s) -
Mat Yajid M. A.,
Wagner T.,
Möbus G.
Publication year - 2008
Publication title -
physica status solidi (rrl) – rapid research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.786
H-Index - 68
eISSN - 1862-6270
pISSN - 1862-6254
DOI - 10.1002/pssr.200701229
Subject(s) - plasmon , nanoscopic scale , electron energy loss spectroscopy , epitaxy , crystallite , phase (matter) , materials science , spectroscopy , analytical chemistry (journal) , layer (electronics) , chemistry , optoelectronics , nanotechnology , physics , metallurgy , organic chemistry , quantum mechanics , chromatography , transmission electron microscopy
An analytical method of quantitative phase identification and mapping on the nanoscale is presented based on correlative similarity mapping from spectrum images within electron energy loss spectroscopy across the low‐loss plasmon region. The method is applied to map the reaction layer formation for heat treated Cu–Al–Al 2 O 3 thin films. Coexistence of residual Al pockets next to polycrystalline but epitaxial CuAl 2 as main reaction product is found as well as a distinctive interfacial plasmon region. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)