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Optical anisotropy of SrLaAIO 4 and SrLaAl 0.75 Ga 0.25 O 4 single crystals
Author(s) -
Hora J.,
Navratil K.,
Humlicek J.,
Berkowski M.
Publication year - 1996
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221950229
Subject(s) - ellipsometry , birefringence , anisotropy , materials science , transmittance , refractive index , optics , uniaxial crystal , spectral line , wavelength , optical axis , perpendicular , analytical chemistry (journal) , chemistry , optoelectronics , thin film , physics , lens (geology) , geometry , mathematics , chromatography , astronomy , nanotechnology
The optical response of uniaxial SrLaAIO 4 (SLA) and SrLaAl 0.75 Ga 0.25 O 4 (SLAG) single crystals is investigated by several techniques ‐ ellipsometry, reflectance, and transmittance. The optical constants in the UV‐VIS region have been obtained from the reflectance and transmittance spectra. A novel method of measurements of the birefringence by spectroscopic ellipsometry is reported. The resulting refractive indices for both polarizations are compared with precise standard measurements performed using a single wavelength null ellipsometer. The reflectivity of SrLaAIO 4 crystals is obtained for both polarizations in the infrared region. The fit of the spectra in terms of Lorentzian oscillators provides a quantitative comparison of the phonon mode parameters with that of LaAIO 3 , and reveals a strong anisotropy of the lattice vibrations polarized along the optical axis and perpendicular to it.