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Neutron reflectivity of perfect crystals excited by high‐frequency ultrasound
Author(s) -
Iolin E. M.,
Rusevich L. L.,
Vrana M.,
Mikula P.,
Lukáş P.
Publication year - 1996
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221950104
Subject(s) - ultrasonic sensor , diffraction , crystal (programming language) , spectrometer , neutron diffraction , materials science , optics , perfect crystal , neutron , excited state , amplitude , scattering , diffraction topography , excitation , silicon , physics , atomic physics , condensed matter physics , x ray crystallography , acoustics , optoelectronics , vacancy defect , programming language , quantum mechanics , computer science
Neutron scattering double‐crystal experiments were realized using high‐frequency ultrasonic excitation in a perfect silicon single crystal. The dependence of rocking curves on the ultrasonic amplitude was measured and compared with the dynamical theory. It was found that the method of the transfer matrix is very useful for the analysis of the influence of the acoustic wave (AW) on the diffraction in very thick crystals. In particular, the pendellösung oscillations are simply and exactly removed from the whole picture of the diffraction pattern. Some exact theoretical conclusions concerning the maximum influence of ultrasound and the deformation at the peak intensity in a double‐crystal spectrometer were also reviewed.