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Deep UV emissions of ionic Cs 2+ F − states in Ne and Ar matrices
Author(s) -
Sliwinski G.,
Bressler Ch.,
Schwentner N.
Publication year - 1996
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221930126
Subject(s) - full width at half maximum , atomic physics , ionization , excitation , dipole , analytical chemistry (journal) , ion , ionic bonding , wavelength , transition dipole moment , excimer , chemistry , materials science , physics , fluorescence , optics , optoelectronics , organic chemistry , chromatography , quantum mechanics
Pulsed electron beam excitation of 0.45 to 0.7% CsF doped in rare gas matrices at 5 K leads to emission bands at 196.5 nm (FWHM 9.6 nm) and 227 nm (FWHM 15 nm) in Ne and at 211.2 nm in Ar. The short‐wavelength bands are assigned to B 2 → X 2 − transitions in the ionic Cs 2+ F − excimer on the basis of transition energies, lineshapes, and the efficiency of Cs 2+ F − ionization by energy transfer from the host. The long‐wavelength band in Ne corresponds to a C 2 II‐A 2 II transition. The 196.5 nm band provides a large cross section for stimulated emission of 2.5 × 10 −16 cm 2 . The red shifts of 0.4 and 0.8 eV of the B → X emission in Ne and Ar, respectively, are discussed in terms of solvation of the Cs 2+ F − ion and of its dipole moment. Optimal concentrations are similar to those obtained for the gas phase.