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Compton Profile of Ruthenium
Author(s) -
Kothari R. K.,
Joshi K. B.,
Sharma M. D.,
Ahuja B. L.,
Sharma B. K.
Publication year - 1995
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221900216
Subject(s) - ruthenium , atom (system on chip) , crystallite , compton scattering , physics , electron , materials science , atomic physics , chemistry , nuclear physics , crystallography , engineering , biochemistry , embedded system , catalysis
Abstract The first measurement of the Compton profile of polycrystalline ruthenium is reported and compared with recent APW calculations of Papanicolaou et al. with and without correlation effects. A comparison with our calculation based on the renormalised‐free‐atom (RFA) model is also made. It is seen that the incorporation of electron correlation effect improves slightly the agreement between APW theory and experiment but the best agreement is found for 4d 7.6 5S 0.4 configuration within the RFA model.