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Estimating Critical‐Point Parameters of Modulated Reflectance Spectra
Author(s) -
Hosea T. J. C.
Publication year - 1995
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221890221
Subject(s) - spectral line , reflectivity , critical point (mathematics) , amplitude , optics , second derivative , kramers–kronig relations , derivative (finance) , point (geometry) , computational physics , materials science , mathematics , physics , mathematical analysis , quantum mechanics , geometry , refractive index , financial economics , economics
Two new methods, based on the 3‐point method and a Kramers‐Kronig transformation, were recently published for estimating the energy, broadening, phase, and amplitude of critical points in modulated reflectance spectra which are describable by Aspnes' third derivative functional form. The use of the techniques is demonstrated by applying them to example experimental spectra, which are photo‐reflectance measurements of stress‐induced splitting of the direct band gap E 0 transition in bulk GaAs. The results are compared and contrasted with those obtained from a least‐squares fit of a theoretical model to the experimental spectra.