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Electronic Structure of Vanadyl Phthalocyanine. Investigations of Thin Film Samples by Electron Energy‐Loss Spectroscopy
Author(s) -
Dahms U.,
Mrwa A.
Publication year - 1995
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221890208
Subject(s) - electron energy loss spectroscopy , valence electron , plasmon , valence (chemistry) , electron , thin film , atomic physics , excitation , spectroscopy , dielectric function , chemistry , quasiparticle , electronic structure , phthalocyanine , analytical chemistry (journal) , range (aeronautics) , dielectric , materials science , condensed matter physics , physics , optoelectronics , computational chemistry , nanotechnology , organic chemistry , quantum mechanics , chromatography , superconductivity , composite material
The energy‐loss function Im (−ε −1 ) of a thin polycrystalline vanadyl phthalocyanine film is determined in the range from 1 to 37 eV from energy‐loss experiments with 50 keV electrons. The electronic structure of the film investigated is analyzed by computing the complex dielectric function ε( E ), optical constants ( n(E) + ik(E) , R(E) , α( E )), and n eff ( E ) using the Kramers‐Kronig analysis of the energy‐loss function. The spectrum of valence electron excitations is primarily interpreted in terms of π−π* and σ−σ* transitions of individual molecules and in terms of the collective excitation of the valence electron ensembles (σ + π plasmon).