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Homogeneous linewidths of excitons in high and low band gap Ga 0.52 In 0.48 P
Author(s) -
Grossmann P.,
Feldmann J.,
Göbel E. O.,
Thomas P.,
Arent D. J.,
Bertness K. A.,
Olson J. M.
Publication year - 1995
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221880153
Subject(s) - band gap , photoluminescence , condensed matter physics , materials science , exciton , homogeneous , picosecond , epitaxy , laser linewidth , optoelectronics , optics , laser , physics , nanotechnology , layer (electronics) , thermodynamics
Photoluminescence and picosecond four‐wave‐mixing experiments are reported on Ga 0.52 In 0.48 P grown by organometallic vapor phase epitaxy on GaAs substrates. The spectral behavior of the homogeneous linewidth in the range of the inhomogeneously broadened band gap excitonic resonance is found to be different for a high band gap as compared to a low band gap structure. Whereas the former shows the normal alloy behavior, the behavior of the low band gap sample supports the assumption that its structure consists of ordered domains with varying degrees of order. This means in particular that the main origin of the inhomogeneous broadening is different for the high and low band gap cases.