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Compton Profile of Ag 2 O
Author(s) -
Bandyopadhyay S.,
Saha S. K.,
Chatterjee A.,
Chatterjee A. K.
Publication year - 1995
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221870236
Subject(s) - compton scattering , atomic physics , atom (system on chip) , crystallite , radiation , oxide , physics , materials science , chemistry , nuclear physics , crystallography , metallurgy , electron , computer science , embedded system
The Compton profile (CP) of polycrystalline silver oxide is measured with the use of 59.54 keV γ‐radiation from a 241 Am source. The experimental data are compared with the renormalized free atom (RFA) model calculation using Watson's +1 well solution for the oxygen 2p state. Oxygen 2p 6 and hybridization of different 4d–5s configurations of Ag are considered in the theoretical calculations. The theoretical values from such calculations agree well with experimental results.