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On the Structure of Micro‐ and Nano‐Crystalline Semiconductors and Semimetals
Author(s) -
Gerlach E.
Publication year - 1995
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221870229
Subject(s) - nanocrystalline material , semiconductor , semimetal , grain size , materials science , fermi level , condensed matter physics , conductivity , nano , wavelength , electron , electrical resistivity and conductivity , nanotechnology , physics , optoelectronics , composite material , quantum mechanics , band gap
It is shown that the size distribution of the grains of micro‐ and nanocrystalline semiconductors and semimetals can be determined from a measurement of the dynamical conductivity Re σ(Ω). Here Ω has to be larger than the plasma resonance frequency, and the average grain size must be smaller than λ F /2 (λ F Fermi wavelength) which is about 100 nm for an electron concentration of 10 15 cm −3 .
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