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A New Approach to the Correlation of the Electrical Properties with Interband and Intraband Transitions of Thin Cr Films
Author(s) -
Fouad S. S.,
Ammar A. H.,
ElFazary M. H.
Publication year - 1995
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221870109
Subject(s) - electrical resistivity and conductivity , thin film , mean free path , materials science , relaxation (psychology) , vacuum evaporation , chromium , analytical chemistry (journal) , condensed matter physics , evaporation , range (aeronautics) , fermi level , optics , electron , chemistry , physics , metallurgy , thermodynamics , nanotechnology , composite material , scattering , psychology , social psychology , chromatography , quantum mechanics
Thin chromium films of thickness ranging from 25 to 80 nm are prepared by thermal evaporation under a vacuum of 1.33 × 10 −3 Pa. The electrical resistivity was inversely proportional to the thickness of the film. The analysis of the electrical resistivity is treated in the frame of the effective mean free path theory of size effect developed by Pichard et al. Such analysis allows the determination of the mean free path l 0 , carrier concentration n c , relaxation time τ, and Fermi energy E F . The optical constants, n and k , of chromium thin films are determined in the spectral range of 200 to 25000 nm. The obtained results agree with the optical conductivities predicted theoretically by Moruzzi et al. In addition, the values of n c , σ s , l 0 , and τ obtained electrically are found to match with those obtained optically.