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A Method of Data Processing for X‐Ray L‐Edge Absorption
Author(s) -
Wang WenCai,
Chen Yu,
Hu TianDou
Publication year - 1994
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221860224
Subject(s) - enhanced data rates for gsm evolution , data processing , absorption edge , line (geometry) , absorption (acoustics) , physics , spectral line , absorption spectroscopy , edge enhancement , image processing , optics , algorithm , mathematics , computer science , geometry , artificial intelligence , condensed matter physics , image (mathematics) , quantum mechanics , band gap , operating system
A method of data processing for the rare earth (RE) L‐edge X‐ray absorption spectrum in materials is presented. Mathematical analyses show that if the L‐edge is decomposed into a Lorentzian line and an arctan curve, their second derivatives are very different and the former represents a symmetric negative peak at the same location as the original Lorentzian peak. The white line (WL) in the RE L‐edge can be separated without decomposition of the edge. This method simplifies the data processing and reduces some artificial factors in data processing. The RE L‐edges in some fluorides and glasses are analyzed by this method and the ordinary method. The changes in the WL intensities at the L‐edges of various materials, which are obtained by two data processing, are consistent to each other.