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Electrodynamic Properties of an Edged High‐Temperature Superconducting Film
Author(s) -
Saif A. G.,
ElSabagh M. A.
Publication year - 1994
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221840217
Subject(s) - condensed matter physics , materials science , superconductivity , current (fluid) , annihilation , field (mathematics) , critical current , high temperature superconductivity , surface (topology) , physics , thermodynamics , geometry , nuclear physics , mathematics , pure mathematics
The structure of the surface barrier and the effect of a transport current on the annihilation of this barrier are investigated for a high‐temperature type‐II superconducting film of arbitrary thickness. It is found that the surface barrier depends on the external field strength, the value of the transport current flowing through the sample, and the orientation of the external field. The results obtained are found in agreement with some previous ones.