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Effect of temperature and electron concentration on the effective polarizability of 2DEG in the silicon inversion layer for surface roughness scattering
Author(s) -
Borzdov V. M.,
Komarov F. F.,
Petrovich T. A.,
Vrubel M. M.,
Zhevnyak O. G.
Publication year - 1994
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221830228
Subject(s) - state (computer science) , polarizability , inversion (geology) , physics , scattering , political science , geology , quantum mechanics , mathematics , algorithm , paleontology , structural basin , molecule
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