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Exciton–Polariton Dispersion of Thin Anthracene Crystals in the Thickness Range of 3 to 0.1 μm
Author(s) -
Hashimoto S.,
Ohno N.,
Itoh M.
Publication year - 1991
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221650124
Subject(s) - polariton , anthracene , exciton , dispersion (optics) , materials science , crystal (programming language) , polarization (electrochemistry) , optics , dispersion relation , resonance (particle physics) , molecular physics , spatial dispersion , reflectivity , range (aeronautics) , refractive index , reflection (computer programming) , condensed matter physics , chemistry , optoelectronics , atomic physics , physics , photochemistry , computer science , programming language , composite material
The effect of crystal thickness on the exciton‐polariton dispersion of anthracene is studied by using melt‐grown crystals with thicknesses ranging from 3 to 0.1 μm. The refractive indices in the vicinity of the first‐exciton resonance are determined for the polarization E ‖ b and E ‖ a by analyzing interference fringes observed in the reflection spectra at 10 K. In contrast to the results reported previously, it is found that the dispersion property is independent of the crystal thickness at least down to 0.1 μm. A comparison of the present result with the thickness‐dependent dispersion formula is presented.