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A model for describing dielectric breakdown in vitreous solids based on the concept of low‐energy excitations
Author(s) -
Danziger M.,
Bernhardt A.
Publication year - 1991
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221640226
Subject(s) - amorphous solid , dielectric , condensed matter physics , materials science , energy (signal processing) , phase (matter) , physics , chemistry , optoelectronics , quantum mechanics , crystallography
The anomalous behaviour of different physical characteristics in vitreous solids compared to the behaviour in the crystalline phase, in particular their dielectric behaviour, can be described by the concept of a system of low‐energy excitations in these solids. This concept is also applicable for amorphous SiO 2 layers in MOS structures. Thus, a model of breakdown behaviour based on the assumption of the existence of fluctuations of correlated local internal electrical fields and low‐energy excitations within these layers is elaborated.