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Dispersion properties of submicron‐thin CdS crystals
Author(s) -
Reznichenko V. Ya.,
Strashnikova M. I.,
Cherny V. V.
Publication year - 1989
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221520230
Subject(s) - refractive index , dispersion (optics) , materials science , optics , spatial dispersion , wavelength , interference (communication) , thin film , optoelectronics , nanotechnology , physics , telecommunications , channel (broadcasting) , computer science
The data are summarized, obtained by interference measurements at 4.2 K, on the dispersion of the refractive index n (λ) of submicron‐thin CdS single crystals. The series of the dispersion curves, n (λ), measured for crystals of different thickness, is approximated by theoretical dependences allowing for spatial dispersion. These data present clear evidence that the refractive index depends on the thickness of crystals provided their dimensions are comparable with the wavelength of light or smaller than the latter.