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On the Integrated Intensity of X‐Ray Diffraction in Crystals with Randomly Distributed Defects
Author(s) -
Holý V.,
Kuběna J.
Publication year - 1989
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221510103
Subject(s) - diffraction , wedge (geometry) , optics , materials science , scattering , reflectivity , formalism (music) , x ray , intensity (physics) , x ray reflectivity , condensed matter physics , crystallography , molecular physics , chemistry , physics , art , musical , visual arts
The dynamical theory of X‐ray diffraction in crystals with randomly distributed small defects based on an optical coherence formalism is used for calculations of integrated reflectivities (in the Laue case) of crystals with statistically placed small precipitates. It is shown that in the case of thinner crystals the integrated reflectivity is influenced mainly by the diffuse scattering, which increases the integrated reflectivity, for thicker crystals a decreasing effect of the diffuse absorption dominates. The calculated thickness dependences of integrated reflectivities are proved experimentally by projection topography of wedge‐shaped crystals with growth striations containing precipitates.