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Single and Multiple Electron Scattering Description in X‐Ray Absorption Spectrum Theory and the Problem of Solid Structure Investigation
Author(s) -
Vedrinskii R. V.,
Bugaev L. A.,
Levin I. G.
Publication year - 1988
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221500134
Subject(s) - extended x ray absorption fine structure , xanes , scattering , formalism (music) , surface extended x ray absorption fine structure , spectral line , electron , atom (system on chip) , absorption spectroscopy , atomic physics , x ray , absorption edge , absorption (acoustics) , chemistry , electron scattering , materials science , molecular physics , physics , optics , condensed matter physics , quantum mechanics , band gap , art , musical , computer science , visual arts , embedded system
The effect of photoelectron double and threefold scattering processes on XANES (in KCl K K‐spectrum, in BaTiO 3 Ti K‐spectrum) and EXAFS (in Re L 3 ‐spectra in ReO 3 at various pressures) are investigated within the spherical wave formalism. The main contributions into the near edge absorption cross‐sections are shown to be due to the photoelectron scattering processes in the approximately linear atomic chains originating and terminating at the absorbing atom. The results obtained for EXAFS show good agreement with the experiment that enables one to solve the bondangle determination problem by EXAFS.