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Collective Plasmon Modes in Thin Semiconductor Films Including the Effect of the Image Charges
Author(s) -
Aharonian K. H.,
Erknapetian H. L.,
Tilley D. R.
Publication year - 1988
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221500117
Subject(s) - plasmon , semiconductor , dielectric , substrate (aquarium) , surface plasmon , thin film , dispersion (optics) , condensed matter physics , wave vector , materials science , charge (physics) , optics , optoelectronics , physics , nanotechnology , quantum mechanics , oceanography , geology
The dispersion of unretarded plasmons in quantized films in the presence of image charge forces is derived. It is shown that the lowest two‐dimensional plasma frequency increases strongly with decreasing film thickness and is independent of wave vector if the film dielectric constant is much larger than that of the substrate. The possibilities for experimental observation are discussed.