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Electrical Resistivity Due to Electron–Phonon Scattering in Thin Gadolinum Films
Author(s) -
UrbaniakKucharczyk A.
Publication year - 1988
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221490215
Subject(s) - electrical resistivity and conductivity , scattering , condensed matter physics , electron scattering , materials science , crystallite , electron , phonon , thin film , phonon scattering , optics , physics , nanotechnology , metallurgy , quantum mechanics
The contribution to the electrical resistivity due to the electron–phonon scattering for the special case of h.c.p. structure is derived. The numerical results obtained for the case of polycrystalline gadolinum films show the resistivity dependence on the film thickness and the surface properties.